Title :
When “almost” is good enough: a fresh look at DSP clock rates
Author :
Rosenfeld, Eric ; Max, Solomon
Author_Institution :
LTX Corp., Westwood, MA, USA
Abstract :
Traditional DSP mixed-signal coherent test techniques require precise frequency ratios. This paper explores the limits of this requirement to define how closely rates must match ideal ratios to obtain proper results. Both worst-case and typical situations are considered. Worst-case conditions allow errors on the order of one part in 200,000,000,000. While small, this error tolerance allows changes in tester architecture that can simplify the design of DSP test programs
Keywords :
clocks; digital signal processing chips; failure analysis; fault tolerant computing; integrated circuit testing; mixed analogue-digital integrated circuits; DSP clock rates; DSP test; error tolerance; mixed-signal coherent test; tester architecture; Circuit testing; Clocks; Design engineering; Digital signal processing; Equations; Frequency conversion; Hardware; Instruments; Measurement techniques; Signal analysis;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743159
