• DocumentCode
    2524513
  • Title

    Improvements to a Range Management System in an Automated Wafer Fabrication Fab

  • Author

    Shikalgar, S.T.

  • Author_Institution
    IBM Syst. & Technol. Group, Hopewell Junction
  • fYear
    2007
  • fDate
    11-12 June 2007
  • Firstpage
    93
  • Lastpage
    95
  • Abstract
    The Range Management system was implemented in IBM´s 300 mm fab located in Hopewell Junction, NY. The fab processes a diverse mix of low and high volume production technologies in conjunction with processing development hardware for future technologies. The implementation of the Range Management system was modified to take advantage of the automated functioning of the fab which has resulted in substantial productivity improvements.
  • Keywords
    automation; semiconductor device manufacture; automated wafer fabrication; productivity improvements; range management system; Dispatching; Fabrication; Hardware; Monitoring; Production systems; Productivity; Resource management; Semiconductor device manufacture; Technology management; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI
  • Conference_Location
    Stresa
  • Print_ISBN
    1-4244-0652-8
  • Type

    conf

  • DOI
    10.1109/ASMC.2007.4595690
  • Filename
    4595690