• DocumentCode
    252457
  • Title

    An overview of digital calibration techniques for pipelined ADCs

  • Author

    Sahoo, Bibhudatta

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Amrita Vishwa Vidyapeetham Univ., Kollam, India
  • fYear
    2014
  • fDate
    3-6 Aug. 2014
  • Firstpage
    1061
  • Lastpage
    1064
  • Abstract
    As device dimensions and supply voltage are shrinking, the design of high-speed and high-resolution analog-to-digital converters (ADCs) is getting more and more challenging. Since the shrinking device sizes enable high-speed and low-power digital circuits, there has been a trend to use digital circuits to estimate and correct for the analog circuit nonidealities (i.e. calibrate) to realize high-performance ADCs. This summary paper enumerates some of the digital techniques that have been adopted in the past two decades to realize high-speed high-resolution pipelined ADCs, which are typically used in communication and imaging applications.
  • Keywords
    analogue-digital conversion; calibration; low-power electronics; analog circuit nonideality; device dimensions; device sizes; digital calibration techniques; digital circuits; high-performance ADCs; high-resolution analog-to-digital converters; high-speed high-resolution pipelined ADC design; low-power digital circuits; supply voltage; Ash; Calibration; Capacitors; Correlation; Dynamic range; Operational amplifiers; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
  • Conference_Location
    College Station, TX
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4799-4134-6
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2014.6908601
  • Filename
    6908601