DocumentCode :
252457
Title :
An overview of digital calibration techniques for pipelined ADCs
Author :
Sahoo, Bibhudatta
Author_Institution :
Dept. of Electron. & Commun. Eng., Amrita Vishwa Vidyapeetham Univ., Kollam, India
fYear :
2014
fDate :
3-6 Aug. 2014
Firstpage :
1061
Lastpage :
1064
Abstract :
As device dimensions and supply voltage are shrinking, the design of high-speed and high-resolution analog-to-digital converters (ADCs) is getting more and more challenging. Since the shrinking device sizes enable high-speed and low-power digital circuits, there has been a trend to use digital circuits to estimate and correct for the analog circuit nonidealities (i.e. calibrate) to realize high-performance ADCs. This summary paper enumerates some of the digital techniques that have been adopted in the past two decades to realize high-speed high-resolution pipelined ADCs, which are typically used in communication and imaging applications.
Keywords :
analogue-digital conversion; calibration; low-power electronics; analog circuit nonideality; device dimensions; device sizes; digital calibration techniques; digital circuits; high-performance ADCs; high-resolution analog-to-digital converters; high-speed high-resolution pipelined ADC design; low-power digital circuits; supply voltage; Ash; Calibration; Capacitors; Correlation; Dynamic range; Operational amplifiers; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location :
College Station, TX
ISSN :
1548-3746
Print_ISBN :
978-1-4799-4134-6
Type :
conf
DOI :
10.1109/MWSCAS.2014.6908601
Filename :
6908601
Link To Document :
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