DocumentCode
252457
Title
An overview of digital calibration techniques for pipelined ADCs
Author
Sahoo, Bibhudatta
Author_Institution
Dept. of Electron. & Commun. Eng., Amrita Vishwa Vidyapeetham Univ., Kollam, India
fYear
2014
fDate
3-6 Aug. 2014
Firstpage
1061
Lastpage
1064
Abstract
As device dimensions and supply voltage are shrinking, the design of high-speed and high-resolution analog-to-digital converters (ADCs) is getting more and more challenging. Since the shrinking device sizes enable high-speed and low-power digital circuits, there has been a trend to use digital circuits to estimate and correct for the analog circuit nonidealities (i.e. calibrate) to realize high-performance ADCs. This summary paper enumerates some of the digital techniques that have been adopted in the past two decades to realize high-speed high-resolution pipelined ADCs, which are typically used in communication and imaging applications.
Keywords
analogue-digital conversion; calibration; low-power electronics; analog circuit nonideality; device dimensions; device sizes; digital calibration techniques; digital circuits; high-performance ADCs; high-resolution analog-to-digital converters; high-speed high-resolution pipelined ADC design; low-power digital circuits; supply voltage; Ash; Calibration; Capacitors; Correlation; Dynamic range; Operational amplifiers; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location
College Station, TX
ISSN
1548-3746
Print_ISBN
978-1-4799-4134-6
Type
conf
DOI
10.1109/MWSCAS.2014.6908601
Filename
6908601
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