DocumentCode
252464
Title
On-chip intelligence: A pathway to self-testable, tunable, and trusted analog/RF ICs
Author
Maliuk, Dzmitry ; Makris, Yiorgos
Author_Institution
Electr. Eng. Dept., Yale Univ., New Haven, CT, USA
fYear
2014
fDate
3-6 Aug. 2014
Firstpage
1077
Lastpage
1080
Abstract
This paper discusses the design of an experimentation platform intended for prototyping low-cost neural networks for on-chip integration, towards supporting built-in self-test, post-production self-calibration, and trust evaluation capabilities. Particular emphasis is given to cost-efficient implementation reflected in stringent area and power constraints of circuits dedicated to neural networks, which, however, should not compromise their learning ability and correct functionality throughout their lifecycle. Our chip consists of a reconfigurable array of synapses and neurons operating below threshold and featuring sub-μW power consumption. The synapse circuits employ dual-mode weight storage: (1) a dynamic mode, for fast bidirectional weight updates during training and (2) a non-volatile mode, for permanent storage of learned functionality. The chip architecture supports two learning models: a multilayer perceptron and an ontogenic neural network. The system performance and learning ability are evaluated on the XOR2 benchmark.
Keywords
analogue integrated circuits; built-in self test; integrated circuit design; integrated circuit testing; neural chips; radiofrequency integrated circuits; XOR2 benchmark; built-in self-test; chip architecture; dual-mode weight storage; dynamic mode; fast bidirectional weight updates; learning ability; multilayer perceptron; nonvolatile mode; on-chip integration; on-chip intelligence; ontogenic neural network; post-production self-calibration; power constraints; power consumption; prototyping low-cost neural networks; reconfigurable array; self-testable analog-RFIC; stringent area; synapse circuits; system performance; trust evaluation capability; trusted analog-RFIC; tunable analog-RFIC; Biological neural networks; Built-in self-test; Hardware; Neurons; Radio frequency; System-on-chip; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location
College Station, TX
ISSN
1548-3746
Print_ISBN
978-1-4799-4134-6
Type
conf
DOI
10.1109/MWSCAS.2014.6908605
Filename
6908605
Link To Document