Title :
Direct optical observation of polyethylene microstructures under field and temperature conditions, before any degradation
Author :
Bertin, C. ; Guastavino, J. ; Briot, M. ; Campus, A. ; Druot, Ph
Author_Institution :
Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
Abstract :
An approach was made to understand the role played by the microstructure of a LPDE in the ageing process of this material under electric stress. An optical observation and an image treatment of the structure evolution reveal a physical behaviour comparable to a “fatigue process”. Although the applied field was about 35 times the working field of a cable we have not observed any tree in the samples
Keywords :
ageing; polyethylene insulation; polymer structure; LPDE; ageing; electric stress; fatigue; microstructure; optical imaging; polyethylene; polymeric insulation; Aging; Chemicals; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Microstructure; Polyethylene; Polymers; Stress; Temperature;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location :
Vasteras
Print_ISBN :
0-7803-4237-2
DOI :
10.1109/ICSD.1998.709276
