Title :
Quad DCVS dynamic logic fault modeling and testing
Author :
Adams, R. Dean ; Cooley, Edmond S. ; Hansen, Patrick R.
Author_Institution :
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
Abstract :
Dynamic logic fails differently than static logic. Fault modeling with Quad Differential Cascode Voltage Switch (DCVS) is studied in simulation and hardware. Appropriate test methods are examined yielding results relevant to general dynamic logic, DCVS, and pass gate DCVS
Keywords :
automatic testing; design for testability; digital simulation; fault simulation; logic design; logic testing; dynamic logic; dynamic logic fault modeling; fault modeling; pass gate DCVS; quad DCVS; quad differential cascode voltage switch; Adders; Circuit faults; Circuit testing; Educational institutions; Logic circuits; Logic design; Logic devices; Logic gates; Logic testing; Switches;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743174
