Title :
Measurement of thermal diffusivity of multilayer optical thin film systems using photoacoustic effect
Author :
Kim, S.W. ; Won, K. U K ; Choi, M.H. ; Hahn, S.H.
Author_Institution :
Dept. of Phys., Ulsan Univ., South Korea
Abstract :
Two-layer anti-reflection (AR) and five-layer high-reflection (HR) optical coating samples on glass substrate were designed and fabricated, for different evaporation conditions (coating speeds of 10 and 20 E/s, and substrate temperatures of 50, 100, 150, 200°C), using two dielectric materials of MgF2 and ZnS which have different refractive indices. The through-plane thermal diffusivity were measured using the photoacoustic effect. The results showed that the thermal diffusivity of the sample fabricated in the conditions of 10 E/s and 150°C showed the maximum value and also, it has quite close relations with the microstructure of the film system
Keywords :
antireflection coatings; magnesium compounds; optical multilayers; photoacoustic effect; thermal diffusivity; thermal variables measurement; zinc compounds; 50 to 200 C; MgF2-ZnS; coating speed; different evaporation conditions; five-layer high-reflection coatings; glass substrate; multilayer optical thin film systems; photoacoustic effect; substrate temperature; thermal diffusivity measurement; through-plane thermal diffusivity; two-layer ARC; Coatings; Dielectric measurements; Dielectric substrates; Glass; Nonhomogeneous media; Optical design; Optical films; Optical refraction; Optical variables control; Temperature;
Conference_Titel :
Science and Technology, 1999. KORUS '99. Proceedings. The Third Russian-Korean International Symposium on
Conference_Location :
Novosibirsk
Print_ISBN :
0-7803-5729-9
DOI :
10.1109/KORUS.1999.876220
