Switch-level bridging fault simulation in the presence of feedbacks

Author

Dahlgren, Peter

Author_Institution

Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden

fYear

1998

fDate

18-23 Oct 1998

Firstpage

363

Lastpage

371

Abstract

This paper investigates the degradation in detectability of bridging faults caused by situations of active feedback and logically unresolvable intermediate values under different fault modeling assumptions. A bridging fault simulator is presented that is based on a combination of switch-level modeling and levelized logic simulation. Levelized simulation is efficient for fault propagation and feedback analysis, whereas the switch-level model is used for determining whether an intermediate value is logically resolvable. A method to extract the logic function of channel graphs is presented in order to perform levelized processing of switch-level networks. The experimental results show that active feedback may reduce fault coverage by as much as 9% for stuck-at test sets and realistic bridging fault sets

Keywords

CMOS logic circuits; VLSI; circuit feedback; discrete event simulation; fault simulation; integrated circuit modelling; logic simulation; logic testing; short-circuit currents; CMOS gates; VLSI testability; active feedback; channel graphs; degradation in detectability; event-driven simulation; fault modeling assumptions; fault propagation; feedback analysis; levelized logic simulation; logic function extraction; logically unresolvable intermediate values; region of logic uncertainty; stuck-at test sets; switch-level bridging fault simulation; switch-level modeling; Bridge circuits; Circuit faults; Circuit testing; Computational modeling; Discrete event simulation; Feedback circuits; Feedback loop; Logic testing; Semiconductor device modeling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743175

Filename

743175