Limited access testing: IEEE 1149.4-instrumentation and methods

Author

McDermid, John

Author_Institution

Manuf. Test Div., Hewlett-Packard Co., Loveland, CO, USA

fYear

1998

fDate

18-23 Oct 1998

Firstpage

388

Lastpage

395

Abstract

The IEEE 1149.4 standard is now poised for inclusion in a new generation of products. Successful application of this important new standard will depend on the availability of supporting methods and instrumentation. While the standard supplies a common architecture, the test engineer must now supply both method and instrumentation. This paper describes proven instrumentation concepts used to demonstrate IEEE 1149.4 measurements on the MEI test chip. Additionally, the paper discusses how current-stimulus and voltage-measurement techniques can be used to diagnose faulty components in medium sized networks of 75 to 150 components. IEEE 1149.4 tests can be automatically generated rather than hand crafted as in functional testing. Unlike digital resting, the technique does not use fault models. Correct operation is found by examining the deviation from nominal performance, greatly simplifying the test development task

Keywords

IEEE standards; automatic test pattern generation; boundary scan testing; built-in self test; design for testability; IEEE 1149.4 standard; MEI test chip; active circuits; automatically generated tests; common architecture; current-stimulus techniques; faulty components diagnosis; instrumentation concepts; limited access testing; test pad location; voltage-measurement techniques; Automatic testing; Circuit faults; Circuit testing; Costs; Electronics packaging; Fixtures; Instruments; Probes; Resistors; Semiconductor device packaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743178

Filename

743178