Title :
Extraction of orthogonal incident state of polarization spectra using mueller matrix approach
Author :
Desfonds, E. ; Pimenov, K. ; Hall, Trevor J.
Abstract :
Novel algorithms based upon Mueller matrix terms m are presented herein. These allow the recovery of the spectra of incident TE and TM orthogonal states of polarization, which yield polarization-dependent frequency shifts and other parameters of interest. This solution involves little computational efforts and has significantly improved the testing capacity and capabilities of the Test and Measurement group of MetroPhotonics Inc.
Keywords :
Circuit testing; Equations; Frequency; Insertion loss; Integrated circuit yield; Polarization; Sampling methods; Tellurium; Transmission line matrix methods; Vectors;
Conference_Titel :
Optical Fiber Measurements, 2004. Technical Digest: Symposium on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
1-886843-37-6
DOI :
10.1109/SOFM.2004.183488
