• DocumentCode
    2524934
  • Title

    Extraction of orthogonal incident state of polarization spectra using mueller matrix approach

  • Author

    Desfonds, E. ; Pimenov, K. ; Hall, Trevor J.

  • fYear
    2004
  • fDate
    28-30 Sept. 2004
  • Firstpage
    115
  • Lastpage
    118
  • Abstract
    Novel algorithms based upon Mueller matrix terms m are presented herein. These allow the recovery of the spectra of incident TE and TM orthogonal states of polarization, which yield polarization-dependent frequency shifts and other parameters of interest. This solution involves little computational efforts and has significantly improved the testing capacity and capabilities of the Test and Measurement group of MetroPhotonics Inc.
  • Keywords
    Circuit testing; Equations; Frequency; Insertion loss; Integrated circuit yield; Polarization; Sampling methods; Tellurium; Transmission line matrix methods; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber Measurements, 2004. Technical Digest: Symposium on
  • Conference_Location
    Boulder, CO, USA
  • Print_ISBN
    1-886843-37-6
  • Type

    conf

  • DOI
    10.1109/SOFM.2004.183488
  • Filename
    1391941
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2524934