Title :
System-level optimization and benchmarking of graphene PN junction logic system based on empirical CPI model
Author :
Pan, Chenyun ; Naeemi, Azad
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
May 30 2012-June 1 2012
Abstract :
Many novel devices are being pursued in recent years to augment or even replace CMOS technology. It is, therefore, important to develop a methodology to effectively evaluate the system-level performance of the emerging technologies. In this paper, an empirical cycles per instruction (CPI) model is presented based on Intel microprocessor family, which can be utilized to quantify the chip throughput for an emerging device technology at the early stage of technology development without detailed design and optimization of a full processor. Graphene pn junction devices are used as a platform for the proposed methodology. It is demonstrated that for the same power density and die size area, the maximum throughput of an optimized graphene logic single-core system can be 35% higher than that of its CMOS counterpart at 15nm technology node.
Keywords :
CMOS logic circuits; circuit optimisation; graphene; microprocessor chips; p-n junctions; CMOS counterpart; CMOS technology; Intel microprocessor family; benchmarking; die size area; emerging device technology; emerging technology; empirical CPI model; empirical cycles per instruction model; full processor; graphene PN junction devices; graphene PN junction logic system; maximum throughput; optimized graphene logic single-core system; power density; system-level optimization; system-level performance evaluation; technology development; technology node; CMOS integrated circuits; Junctions; Logic gates; Microprocessors; Optimization; Throughput; Transistors; empirical CPI model; graphene pn junction; system-level optimization; throughput;
Conference_Titel :
IC Design & Technology (ICICDT), 2012 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0146-6
Electronic_ISBN :
pending
DOI :
10.1109/ICICDT.2012.6232850