Title :
High-coverage ATPG for datapath circuits with unimplemented blocks
Author :
Kim, Hyungwon ; Hayes, John P.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Conventional ATPG cannot effectively handle designs employing IP circuits (cores) whose implementation details are either unknown, unavailable, or subject to change. A new ATPG program RIBTEC for such designs is described that employs a functional (behavioral) fault model based on a class of non-exhaustive “universal” test sets. Given a circuit´s high-level block structure, RIBTEC constructs a universal test set for each block from its functional description in such a way that realization-independence of the blocks is ensured. Experimental results are presented for representative datapath circuits, which show that RIBTEC achieves very high fault coverage and an exceptionally high level of realization independence
Keywords :
VLSI; automatic test pattern generation; fault diagnosis; industrial property; integrated circuit testing; logic testing; IP circuits; RIBTEC; cores; datapath circuits; functional fault; high-coverage ATPG; high-level block structure; nonexhaustive universal test set; representative datapath circuits; unimplemented blocks; universal test set; Automatic test pattern generation; Circuit faults; Circuit testing; Design for testability; Design methodology; Electrical fault detection; Fault detection; Logic arrays; Logic testing; Very large scale integration;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743201