• DocumentCode
    2525439
  • Title

    A Reduced Complexity K-Best SD Algorithm Based on Chi-Square Distribution for MIMO Detection

  • Author

    Mao, Xinyu ; Ren, Shubo ; Lu, Luxi ; Xiang, Haige

  • Author_Institution
    Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing, China
  • fYear
    2011
  • fDate
    5-8 Sept. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A reduced K-best sphere decoding (K-best SD) algorithm for Multiple-Input Multiple-Output (MIMO) detection is proposed. The algorithm reduces the complexity of the K-best SD by combining the statistics character of the signal and the requirement of the quality of service (QoS). In the reducing processing of the proposed algorithm, the chi-square distribution (CSD) property of the signal, the optimal symbol error rate (SER) property and the loss of pruning are considered together to give a theoretic error bound and then a threshold to determined which route can be pruned to reduced the calculation complexity. The algorithm reduces the complexity with a controllable cost of performance decrease. Simulation results on a 16QAM system with 4×4 antennas show that the algorithm can attain the near-optimal performance with a significant complexity reduction comparing to the original K-best SD or maximum likelihood (ML) algorithm.
  • Keywords
    MIMO communication; antenna arrays; decoding; error statistics; quadrature amplitude modulation; quality of service; signal detection; statistical distributions; 16QAM system; MIMO detection; QoS; chi-square distribution; maximum likelihood algorithm; multiple-input multiple-output detection; optimal symbol error rate; quality of service; reduced K-best sphere decoding algorithm; reduced complexity K-best SD algorithm; theoretic error bound; Algorithm design and analysis; Approximation algorithms; Complexity theory; MIMO; Maximum likelihood decoding; Signal to noise ratio; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference (VTC Fall), 2011 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    1090-3038
  • Print_ISBN
    978-1-4244-8328-0
  • Type

    conf

  • DOI
    10.1109/VETECF.2011.6093184
  • Filename
    6093184