Title :
Testing the design: the evolution of test simulation
Author :
Force, Craig ; Austin, Tom
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
In work done in cooperation with Texas Instruments, Analogy, and Teradyne it has been demonstrated that a simulation of a complete test system when combined with design models of an integrated circuit can reduce the cycle time required to get a new product to market. This paper will describe the development of such a system, its inclusion in the design flow for new IC development, and the resulting improvements in new product introduction from the viewpoint of design and test
Keywords :
automatic testing; circuit simulation; design for testability; digital simulation; integrated circuit testing; Analogy; IC testing; Teradyne; Texas Instruments; cycle time; design models; integrated circuit; simulation; test simulation; Automatic testing; Circuit simulation; Circuit testing; Data engineering; Design engineering; Engines; Instruments; Integrated circuit testing; Signal design; System testing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743205
