Title :
Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction
Author :
Kawasumi, A. ; Takeyama, Y. ; Hirabayashi, O. ; Kushida, K. ; Tachibana, F. ; Niki, Y. ; Sasaki, S. ; Yabe, T.
fDate :
May 30 2012-June 1 2012
Abstract :
The transistor variability deteriorates the energy consumption in SRAM. Especially it increases the energy consumed at the bitlines, which is the major portion of the total energy. The influence of the variation is enhanced at lower supply voltage, thus the voltage reduction sometimes degrades the energy efficiency. In this paper, we present circuit techniques that can reduce the SRAM energy consumption without the supply voltage scaling. An energy-efficient hierarchical bitline scheme can save energy consumption used for the bitline precharge. An energy-efficient offset-cancelling circuit and a process-variability-robust timing-generating circuit are also proposed.
Keywords :
SRAM chips; energy conservation; low-power electronics; power aware computing; power supply circuits; timing circuits; SRAM energy consumption; SRAM techniques; bitline precharge; bitlines; circuit techniques; energy efficiency deterioration; energy saving; energy-efficient hierarchical bitline scheme; energy-efficient offset-cancelling circuit; lower supply voltage; process-variability-robust timing-generating circuit; supply voltage scaling; transistor variability; voltage reduction; Degradation; Energy consumption; Energy efficiency; Random access memory; Stability analysis; Timing; Transistors; SRAM; energy reduction; variability;
Conference_Titel :
IC Design & Technology (ICICDT), 2012 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0146-6
Electronic_ISBN :
pending
DOI :
10.1109/ICICDT.2012.6232859