• DocumentCode
    2525546
  • Title

    Characteristics of ZnO/diamond/Si SAW resonators

  • Author

    Hachigo, A. ; Richie, S.M. ; Malocha, D.C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Central Florida, Orlando, FL, USA
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    199
  • Lastpage
    207
  • Abstract
    The surface acoustic wave (SAW) resonator response of ZnO/diamond/Si layered structures are calculated and discussed including velocity dispersion. Smith´s second equivalent circuit including energy storage effects is used to calculate the resonator response. The effect of velocity dispersion appears for the shift of resonant frequency to the expected center frequency, and appears for the bandwidth of resonator becoming narrower than that of the nondispersive case. The coupling of modes equation is modified for the velocity dispersion to explain these effects. The reflection coefficients of gratings are calculated for velocity dispersive case and the non velocity dispersive case. These results agree with the response calculated by the equivalent circuit model. Assuming the deviation of velocity dispersion is small neighboring the resonance area, the effect of velocity dispersion is explained theoretically. The ZnO/diamond/Si SAW resonators provide high frequency operation and high quality factor (Q) SAW resonators due to the velocity dispersion
  • Keywords
    Q-factor; diamond; equivalent circuits; silicon; surface acoustic wave resonators; ultrasonic dispersion; zinc compounds; SAW resonators; Smith´s second equivalent circuit; ZnO-C-Si; coupling of modes equation; energy storage effects; high frequency operation; quality factor; reflection coefficients; resonator response; velocity dispersion; Acoustic waves; Bandwidth; Coupling circuits; Dispersion; Energy storage; Equations; Equivalent circuits; Resonant frequency; Surface acoustic waves; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.559844
  • Filename
    559844