Title : 
A comprehensive approach to the partial scan problem using implicit state enumeration
         
        
            Author : 
Kalla, Priyank ; Ciesielski, Maciej J.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
         
        
        
        
        
        
            Abstract : 
This paper presents a novel technique and a practical algorithm for the selection of state registers for partial scan. Our model uses implicit techniques for FSM traversal to identify non-controllable state registers. Non-controllability of registers is evaluated by a systematic analysis of the state transitions and the encoding of the underlying FSM. By using our approach, we can not only identify non-controllable and difficult-to-control flip-flops, but also exploit the information of the unreachable states to judiciously select the minimum number of scan registers for high fault coverage. The effectiveness of our technique is illustrated over a large set of MCNC and ISCAS benchmarks. The results demonstrate the superiority of our method over conventional state-of-the-art scan register selection techniques in terms of higher fault coverage achieved by selecting fewer partial scan registers
         
        
            Keywords : 
fault diagnosis; finite state machines; flip-flops; logic testing; performance evaluation; shift registers; FSM traversal; ISCAS benchmarks; MCNC; SIMPSON algorithm; effectiveness; encoding; fault coverage; finite state machine; flip-flops; implicit state enumeration; noncontrollable state registers; partial scan; partial scan registers; scan register selection; state registers; state transitions; systematic analysis; Automatic testing; Circuit faults; Circuit testing; Controllability; Costs; Flip-flops; Pattern analysis; Registers; Sequential analysis; Sequential circuits;
         
        
        
        
            Conference_Titel : 
Test Conference, 1998. Proceedings., International
         
        
            Conference_Location : 
Washington, DC
         
        
        
            Print_ISBN : 
0-7803-5093-6
         
        
        
            DOI : 
10.1109/TEST.1998.743209