DocumentCode :
2525612
Title :
A novel combinational testability analysis by considering signal correlation
Author :
Chang, Shih-Chieh ; Chang, Shi-Sen ; Jone, Wen-Ben ; Tsai, Chien-Chung
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., China
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
658
Lastpage :
667
Abstract :
To predict the difficulty of testing a wire stuck-at fault, testability analysis algorithms provide an estimated testability value by computing controllability and observability. In all previous work, signal correlation between controllability and observability is generally ignored. As a result, the estimated value can be inaccurate. This paper discusses an efficient method to take into account signal correlation for testability analysis. Our experimental results have shown that, with little run time overhead, significant improvement of testability analysis can be achieved
Keywords :
automatic test pattern generation; combinational circuits; controllability; correlation methods; logic testing; observability; performance evaluation; probability; combinational logic circuit; combinational testability analysis; controllability; logic testing; observability; run time overhead; signal correlation; wire stuck-at fault; Algorithm design and analysis; Circuit faults; Circuit testing; Computer graphics; Computer science; Controllability; Observability; Signal analysis; Time measurement; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743210
Filename :
743210
Link To Document :
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