• DocumentCode
    2525612
  • Title

    A novel combinational testability analysis by considering signal correlation

  • Author

    Chang, Shih-Chieh ; Chang, Shi-Sen ; Jone, Wen-Ben ; Tsai, Chien-Chung

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., China
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    658
  • Lastpage
    667
  • Abstract
    To predict the difficulty of testing a wire stuck-at fault, testability analysis algorithms provide an estimated testability value by computing controllability and observability. In all previous work, signal correlation between controllability and observability is generally ignored. As a result, the estimated value can be inaccurate. This paper discusses an efficient method to take into account signal correlation for testability analysis. Our experimental results have shown that, with little run time overhead, significant improvement of testability analysis can be achieved
  • Keywords
    automatic test pattern generation; combinational circuits; controllability; correlation methods; logic testing; observability; performance evaluation; probability; combinational logic circuit; combinational testability analysis; controllability; logic testing; observability; run time overhead; signal correlation; wire stuck-at fault; Algorithm design and analysis; Circuit faults; Circuit testing; Computer graphics; Computer science; Controllability; Observability; Signal analysis; Time measurement; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743210
  • Filename
    743210