Title :
A novel combinational testability analysis by considering signal correlation
Author :
Chang, Shih-Chieh ; Chang, Shi-Sen ; Jone, Wen-Ben ; Tsai, Chien-Chung
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., China
Abstract :
To predict the difficulty of testing a wire stuck-at fault, testability analysis algorithms provide an estimated testability value by computing controllability and observability. In all previous work, signal correlation between controllability and observability is generally ignored. As a result, the estimated value can be inaccurate. This paper discusses an efficient method to take into account signal correlation for testability analysis. Our experimental results have shown that, with little run time overhead, significant improvement of testability analysis can be achieved
Keywords :
automatic test pattern generation; combinational circuits; controllability; correlation methods; logic testing; observability; performance evaluation; probability; combinational logic circuit; combinational testability analysis; controllability; logic testing; observability; run time overhead; signal correlation; wire stuck-at fault; Algorithm design and analysis; Circuit faults; Circuit testing; Computer graphics; Computer science; Controllability; Observability; Signal analysis; Time measurement; Wire;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743210