DocumentCode
2525612
Title
A novel combinational testability analysis by considering signal correlation
Author
Chang, Shih-Chieh ; Chang, Shi-Sen ; Jone, Wen-Ben ; Tsai, Chien-Chung
Author_Institution
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., China
fYear
1998
fDate
18-23 Oct 1998
Firstpage
658
Lastpage
667
Abstract
To predict the difficulty of testing a wire stuck-at fault, testability analysis algorithms provide an estimated testability value by computing controllability and observability. In all previous work, signal correlation between controllability and observability is generally ignored. As a result, the estimated value can be inaccurate. This paper discusses an efficient method to take into account signal correlation for testability analysis. Our experimental results have shown that, with little run time overhead, significant improvement of testability analysis can be achieved
Keywords
automatic test pattern generation; combinational circuits; controllability; correlation methods; logic testing; observability; performance evaluation; probability; combinational logic circuit; combinational testability analysis; controllability; logic testing; observability; run time overhead; signal correlation; wire stuck-at fault; Algorithm design and analysis; Circuit faults; Circuit testing; Computer graphics; Computer science; Controllability; Observability; Signal analysis; Time measurement; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743210
Filename
743210
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