• DocumentCode
    2525633
  • Title

    International space station (ISS) truss orbital replaceable unit (ORU) overvoltage transient resolution

  • Author

    Aintablian, Harry ; Fassburg, H. David ; Soendker, Erich

  • Author_Institution
    Boeing Co., Canogo Park, CA, USA
  • fYear
    2004
  • fDate
    29-31 July 2004
  • Firstpage
    51
  • Lastpage
    55
  • Abstract
    On the international space station (ISS), power quality specifications are designed to ensure system stability and operability of electronic hardware. System-level test data and model analysis results are verified against the power quality specifications. The process of mitigating power quality violations involves two main options: 1) redesign the hardware to meet the requirements or 2) process power quality requirement exceptions after a thorough and careful impact analysis on the system and its loads, called orbital replaceable units (ORUs). During the ISS system integration testing, system voltage transients were observed on the secondary bus that violated power quality requirements during start-up of one of the ORUs. The system overvoltage transient test data are presented and analyzed. The system overvoltage resolution plan is outlined. Finally, the impacts of the voltage transients on other ORUs connected to the power bus are assessed.
  • Keywords
    overvoltage; power supply quality; power system transient stability; space vehicle power plants; electronic hardware; international space station system integration testing; orbital replaceable unit; overvoltage transient resolution; power bus; power quality specifications; system stability; system-level test data; Data analysis; Hardware; International Space Station; Power quality; Power system transients; Qualifications; Stability; Steady-state; System testing; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference, 2002. IECEC '02. 2002 37th Intersociety
  • Print_ISBN
    0-7803-7296-4
  • Type

    conf

  • DOI
    10.1109/IECEC.2002.1391973
  • Filename
    1391973