Defect-oriented testing of mixed-signal ICs: some industrial experience

Author

Xing, Y.

Author_Institution

Philips Semicond., Nijmegen, Netherlands

fYear

1998

fDate

18-23 Oct 1998

Firstpage

678

Lastpage

687

Abstract

Some of Philips´ industrial experience are presented in this paper on defect-oriented testing of mixed-signal ICs. Case studies on analog circuit blocks in two automotive mixed-signal ICs are described. This is done to demonstrate the potential of the defect-oriented testing approach in the industrial test development for test coverage improvement with simple industrial tests. It has been shown that, in addition to the conventional function-oriented tests, the test coverage of bridging faults can be significantly improved by some simple tests derived by using the defect-oriented testing approach

Keywords

CMOS integrated circuits; analogue integrated circuits; automotive electronics; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; CAN protocol; IDDQ test; Philips; air bag control; analog circuit; automotive IC; bridging faults; defect-oriented testing; fault masking; industrial test; mixed-signal IC; test coverage; wafer yield; Analog circuits; Automatic testing; Automotive engineering; Circuit faults; Circuit testing; Costs; Digital integrated circuits; Integrated circuit testing; Semiconductor device testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743212

Filename

743212