Stimulus generation for built-in self-test of charge-pump phase-locked loops

Author

Veillette, Benoît R. ; Roberts, Gordon W.

Author_Institution

Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada

fYear

1998

fDate

18-23 Oct 1998

Firstpage

698

Lastpage

707

Abstract

This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in self-test applications. It is shown that three nodes of the PLL qualify for test signal injection. The hardware and methodology for each are discussed. In particular, a comprehensive explanation of the use of delta-sigma modulation in the time domain is provided. Furthermore, implementation issues of analog tests with signal generation based on coarse quantization are discussed. The effects of the quantization noise arising from delta-sigma modulation on the dynamic range of phase-locked loop nodes is evaluated. Original experimental results validate one of the method which was not verified previously. In conclusion, the strengths and weakness of each of the three methods for phase-locked loop stimulation are highlighted

Keywords

built-in self test; circuit feedback; delta-sigma modulation; frequency synthesizers; peak detectors; phase locked loops; phase modulation; quantisation (signal); PLL feedback; VCO; analog tests; built-in self-test; charge-pump PLL; coarse quantization; delta-sigma modulation; digital synthesis; dynamic range; implementation issues; jitter generation; phase detector output; phase modulation; phase-locked loop nodes; quantization noise; stimulus generation; test signal injection; time domain; Built-in self-test; Charge pumps; Delta-sigma modulation; Dynamic range; Hardware; Phase locked loops; Phase noise; Quantization; Signal generators; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743214

Filename

743214