DocumentCode :
2525816
Title :
Depression of Insulator Charging in Vacuum by Partial Mechanical Processing
Author :
Yamamoto, O. ; Markon, S. ; Morii, Hiroshi ; Omura, Hiroshi
Author_Institution :
Kyoto Univ.
Volume :
1
fYear :
2006
fDate :
25-29 Sept. 2006
Firstpage :
144
Lastpage :
147
Abstract :
This paper describes experimental results on surface charging of partially mechanically processed insulators in vacuum. The charging phenomena were observed when insulators were exposed to a ramped dc voltage, by using a capacitive probe embedded in the cathode. First, we examined a partially roughened cylindrical insulator. The height of the roughened surface measured from the cathode, was varied while keeping the total length of the insulator constant. Second, in the same way, we examined a cylindrical insulator having a truncated conical frustum or a chamfer at its cathode-side end. Based on these experiments we have proved that the partial mechanical processing is effective for suppressing insulator charging in vacuum
Keywords :
surface charging; surface roughness; vacuum insulation; insulator charging; partial mechanical processing; partially roughened cylindrical insulator; surface charging; truncated conical frustum; Cathodes; Dielectrics and electrical insulation; Electron emission; Probes; Rough surfaces; Shape; Surface charging; Surface discharges; Surface roughness; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
Conference_Location :
Matsue
ISSN :
1093-2941
Print_ISBN :
1-4244-0191-7
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2006.357252
Filename :
4194832
Link To Document :
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