Title :
A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing
Author :
Soussan, Dimitri ; Valentian, Alexandre ; Majcherczak, Sylvain ; Belleville, Marc
Author_Institution :
STMicroelectron. Crolles, Crolles, France
fDate :
May 30 2012-June 1 2012
Abstract :
A mixed analog/digital impedance calibration circuit for LPDDR2 transmitter is proposed, taking advantage of the Fully Depleted SOI technology and its back biasing capability. This feature allows to modulate the current, and hence the impedance of the output driver. While the process deviation is compensated digitally, the proposed technique gives the opportunity to compensate for temperature and voltage drifts during transmission thanks to back biasing control.
Keywords :
driver circuits; electric impedance; integrated circuit testing; silicon-on-insulator; LPDDR2 transmitter; double data rate; fully-depleted SOI back-biasing; mixed LPDDR2 impedance calibration; mixed analog-digital impedance calibration circuit; output driver impedance; size 28 nm; temperature; voltage drift; Arrays; Calibration; Impedance; Resistance; Standards; Transistors; Transmitters; Back-Biasing; FDSOI; Impedance Calibration; LPDDR2; Output driver; Reflection; Signal integrity;
Conference_Titel :
IC Design & Technology (ICICDT), 2012 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0146-6
Electronic_ISBN :
pending
DOI :
10.1109/ICICDT.2012.6232877
