• DocumentCode
    2525923
  • Title

    The surface acoustic wave propagation characteristics of 41° lithium niobate with thin-film SiO2

  • Author

    Hickernell, F.S. ; Knuth, H.D. ; Dablemont, R.C. ; Hickernell, T.S.

  • Author_Institution
    Motorola Gov. & Space Technol. Group, Scottsdale, AZ, USA
  • fYear
    1996
  • fDate
    5-7 Jun 1996
  • Firstpage
    216
  • Lastpage
    221
  • Abstract
    The surface acoustic wave (SAW) propagation properties of 41° Y-X lithium niobate (LiNbO3) with SiO2 film layers have been investigated using interdigital transducer structures. Different thicknesses of SiO2 from 500 nm to 1500 nm were deposited on the 41° LiNbO3 by RF diode sputtering from a glass target. An arrayed transducer pattern of aluminum interdigital transducer electrodes on the upper SiO2 film surface facilitated the excitation of a wide frequency band of harmonic waves and permitted delineation of SAW velocity and propagation loss characteristics for several values of film-thickness to acoustic-wavelength (t/λ) ratio. With resonator patterns at the substrate/film interface, the capacitance ratio (Cm/C0 ), related to coupling factor, and the temperature coefficient of frequency (TCF) were determined
  • Keywords
    interdigital transducers; lithium compounds; losses; silicon compounds; sputter deposition; surface acoustic wave transducers; ultrasonic propagation; ultrasonic velocity; 500 to 1500 nm; LiNbO3-SiO2; RF diode sputtering; SAW velocity; acoustic-wavelength ratio; arrayed transducer pattern; capacitance ratio; coupling factor; harmonic waves; interdigital transducer structures; loss characteristics; surface acoustic wave propagation characteristics; temperature coefficient of frequency; Acoustic propagation; Acoustic transducers; Acoustic waves; Aluminum; Diodes; Glass; Lithium niobate; Radio frequency; Sputtering; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-3309-8
  • Type

    conf

  • DOI
    10.1109/FREQ.1996.559846
  • Filename
    559846