• DocumentCode
    2526218
  • Title

    Development process of surface flashover along alumina ceramics under AC voltage in vacuum

  • Author

    Zhang, G.J. ; Yan, Z. ; Liu, Y.S. ; Okada, M. ; Yasuoka, K. ; Ishii, S.

  • Author_Institution
    Xi´´an Jiaotong Univ., China
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    809
  • Abstract
    Using optical methods, the light emission from alumina ceramic surface during the developing process of flashover was investigated under ac voltage in vacuum. A new planar surface model was designed in this study. In order to keep a fine contact between electrodes and alumina, gold films were sputtered onto the surface of alumina samples. Two types of optical patterns, i.e., surface electroluminescence (EL) under lower voltage application (stage A) and light emission due to surface partial discharges (PD) under higher voltage (stage B), were observed, respectively. Two stages of light emission showed distinct optical spectra, phase-resolved and space-resolved distribution. The EL is concluded to occur prior to the field electron emission and it is due to the recombination of charge carriers injected from electrodes into the surface layer of alumina. Moreover, it is supposed that the space charge accumulation from injected charges would affect the initiation and development of surface flashover greatly
  • Keywords
    alumina; ceramics; flashover; AC voltage; Al2O3; alumina ceramics; charge carriers recombination; field electron emission; light emission; lower voltage application; optical methods; optical patterns; optical spectra; planar surface model; surface electroluminescence; surface flashover; surface partial discharges; vacuum; Ceramics; Electrodes; Electroluminescence; Flashover; Gold; Optical films; Partial discharges; Stimulated emission; Surface discharges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5459-1
  • Type

    conf

  • DOI
    10.1109/ICPADM.2000.876353
  • Filename
    876353