Title :
EM analysis of shielding strategies to reduce substrate noise in silicon based technology
Author :
Bajon, D. ; Wane, S. ; Baudrand, H. ; Gamand, P.
Author_Institution :
SUPAERO, Toulouse, France
Abstract :
EM fullwave analysis intends to become an alternative to the required wire experimental investigations on substrate noise reduction techniques. From a dedicated home-made full-wave simulator, a comprehensive analysis of guard ring and shielding techniques is developed in view to enhance their specific efficiency; intensive field and current distribution support the analysis and isolation capabilities are discussed.
Keywords :
circuit simulation; electromagnetic shielding; integrated circuit noise; substrates; EM analysis; comprehensive analysis; current distribution; full-wave simulator; guard ring; intensive field distribution; shielding strategies; silicon based technology; substrate noise reduction; Analytical models; Circuit noise; Circuit simulation; Frequency; Impedance; Noise reduction; Protection; Semiconductor device noise; Silicon; Substrates;
Conference_Titel :
Microwave Conference, 2003. 33rd European
Print_ISBN :
1-58053-834-7
DOI :
10.1109/EUMC.2003.1262973
