• DocumentCode
    2526361
  • Title

    Detecting Voltage Glitch Attacks on Secure Devices

  • Author

    Yanci, Asier Goikoetxea ; Pickles, Stephen ; Arslan, Tughrul

  • Author_Institution
    Inst. for Syst. Level Integration, Livingston, UK
  • fYear
    2008
  • fDate
    4-6 Aug. 2008
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    Secure devices are often subject to attacks and behavioural analysis in order to inject faults on them and/or extract otherwise secret information. Glitch attacks, sudden changes on the power supply rails, are a common technique used to inject faults on electronic devices. Detectors are designed to catch these attacks. As the detectors become more efficient, new glitches that are harder to detect arise. Common glitch detection approaches, such as directly monitoring the power rails, can potentially find it hard to detect fast glitches, as these become harder to differentiate from noise. This paper proposes a design which, instead of monitoring the power rails, monitors the effect of a glitch on a sensitive circuit, hence reducing the risk of detecting noise as glitches.
  • Keywords
    circuit reliability; digital circuits; electronic devices; power supply rails; secure devices; voltage glitch attacks; Circuit faults; Circuit noise; Data mining; Detectors; Information analysis; Monitoring; Noise reduction; Power supplies; Rails; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bio-inspired Learning and Intelligent Systems for Security, 2008. BLISS '08. ECSIS Symposium on
  • Conference_Location
    Edinburgh
  • Print_ISBN
    978-0-7695-3265-3
  • Type

    conf

  • DOI
    10.1109/BLISS.2008.26
  • Filename
    4595799