DocumentCode :
2526361
Title :
Detecting Voltage Glitch Attacks on Secure Devices
Author :
Yanci, Asier Goikoetxea ; Pickles, Stephen ; Arslan, Tughrul
Author_Institution :
Inst. for Syst. Level Integration, Livingston, UK
fYear :
2008
fDate :
4-6 Aug. 2008
Firstpage :
75
Lastpage :
80
Abstract :
Secure devices are often subject to attacks and behavioural analysis in order to inject faults on them and/or extract otherwise secret information. Glitch attacks, sudden changes on the power supply rails, are a common technique used to inject faults on electronic devices. Detectors are designed to catch these attacks. As the detectors become more efficient, new glitches that are harder to detect arise. Common glitch detection approaches, such as directly monitoring the power rails, can potentially find it hard to detect fast glitches, as these become harder to differentiate from noise. This paper proposes a design which, instead of monitoring the power rails, monitors the effect of a glitch on a sensitive circuit, hence reducing the risk of detecting noise as glitches.
Keywords :
circuit reliability; digital circuits; electronic devices; power supply rails; secure devices; voltage glitch attacks; Circuit faults; Circuit noise; Data mining; Detectors; Information analysis; Monitoring; Noise reduction; Power supplies; Rails; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bio-inspired Learning and Intelligent Systems for Security, 2008. BLISS '08. ECSIS Symposium on
Conference_Location :
Edinburgh
Print_ISBN :
978-0-7695-3265-3
Type :
conf
DOI :
10.1109/BLISS.2008.26
Filename :
4595799
Link To Document :
بازگشت