• DocumentCode
    2526363
  • Title

    3D modeling of rapid thermal processors for design optimization of a new flexible RTP system

  • Author

    Yunzhong Chen ; Booth, L. ; Schaper, C. ; Khuri-Yakub, B.T. ; Saraswat, K.C.

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., CA, USA
  • fYear
    1994
  • fDate
    11-14 Dec. 1994
  • Firstpage
    545
  • Lastpage
    548
  • Abstract
    A "virtual reactor" methodology for optimal design of a rapid thermal processor (RTP) to obtain the best possible wafer temperature uniformity is described in this paper. Given the equipment configuration, e.g., the lamp array, a three-dimensional simulator is used to predict the wafer temperature profiles for various lamp array designs for different processing conditions. The only experimental input needed is the spatial light flux distribution of the individual tungsten-halogen bulb which forms the lamp array. The simulations show that the flux distribution of the heating source significantly affects the temperature pattern of the wafer. Based on these results, a new RTP system with an adjustable reflector and multivariable control has been designed.<>
  • Keywords
    heating; multivariable control systems; power control; rapid thermal processing; semiconductor process modelling; simulation; temperature control; thermal analysis; 3D modeling; adjustable reflector; design optimization; flexible RTP system; lamp array designs; multivariable control; processing conditions; rapid thermal processors; spatial light flux distribution; temperature pattern; three-dimensional simulator; tungsten-halogen bulb; virtual reactor methodology; wafer temperature profiles; wafer temperature uniformity; Design methodology; Design optimization; Heating; Lamps; Optical arrays; Predictive models; Process design; Rapid thermal processing; Semiconductor device modeling; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2111-1
  • Type

    conf

  • DOI
    10.1109/IEDM.1994.383349
  • Filename
    383349