Title :
RMS percent of wavelet transform for the detection of stochastic high impedance faults
Author :
Lai, T.M. ; Lo, W.E. ; To, W.M. ; Lam, K.H.
Author_Institution :
Macao Polytech. Inst., Macau, China
Abstract :
High impedance faults (HIF) are faults which are difficult to detect by overcurrent protection relays. This paper presents a practical pattern recognition based algorithm for electric distribution high impedance fault detection. The scheme recognizes the distortion of the voltage and current waveforms caused by the arcs usually associated with HIF. The analysis using rms ratios of Discrete Wavelet Transform (DWT) yields three phase voltage and current in the low frequency range which are fed to a classifier for pattern recognition. The classifier is based on the algorithm using artificial neural network (ANN) approach. A HIF model was also developed, where the random nature of the arc was simulated using MATLAB.
Keywords :
discrete wavelet transforms; distortion; electric impedance; neural nets; overcurrent protection; pattern classification; power engineering computing; ANN approach; DWT; HIF model; MATLAB; RMS percent; arc random nature; artificial neural network approach; current waveforms; discrete wavelet transform; electric distribution high impedance fault detection; low frequency range; overcurrent protection relay detection; pattern recognition based algorithm; phase current; phase voltage; stochastic high impedance fault detection; voltage distortion; wavelet transform; Analytical models; Current measurement; Discrete wavelet transforms; Frequency measurement; Generators; Indexes; High Impedance Faults; Pattern Recognition; Wavelet Transforms;
Conference_Titel :
Harmonics and Quality of Power (ICHQP), 2012 IEEE 15th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4673-1944-7
DOI :
10.1109/ICHQP.2012.6381245