DocumentCode
2526515
Title
On applying non-classical defect models to automated diagnosis
Author
Saxena, Jayashree ; Butler, Kenneth M. ; Balachandran, Hari ; Lavo, David B. ; Chess, Brian ; Larrabee, Tracy ; Ferguson, F. Joel
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
748
Lastpage
757
Abstract
Automated fault diagnosis based on the stuck-at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine
Keywords
application specific integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; logic testing; TI ASIC design; automated fault diagnosis; bridging defects; bridging fault; focused ion beam machine; nonclassical defect models; stuck-at fault model; Circuit faults; Debugging; Electron microscopy; Fault diagnosis; Instruments; Manufacturing industries; Monolithic integrated circuits; Optical microscopy; Silicon; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743256
Filename
743256
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