Title :
A new path-oriented effect-cause methodology to diagnose delay failures
Author :
Hsu, Yuan-Chieh ; Gupta, Sandeep K.
Author_Institution :
Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
A new methodology to diagnose delay failures is described. Key characteristics of the methodology are: (a) path-oriented diagnosis, (b) effect-cause reasoning, and (c) utilization of information obtained from the passing vectors. Two new representations are developed to make manageable the complexity of a path-oriented methodology. The results of diagnosis are: (a) proven to include all possible causes of observed delay errors, and (b) empirically found to have very high resolution
Keywords :
automatic testing; delays; failure analysis; fault diagnosis; high-speed integrated circuits; integrated circuit testing; logic testing; IC testing; delay failures; effect-cause reasoning; high speed circuits; passing vectors; path-oriented diagnosis; path-oriented effect-cause methodology; resolution; Circuit simulation; Clocks; Delay effects; Design methodology; Frequency; Safety; Silicon; Switches; Testing; Timing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743257
