Title :
The 3-D fractal analysis of electrical trees using a serial sectioning method and a CT method
Author :
Uehara, Hiroaki ; Kudo, Katsutoshi
Author_Institution :
Dept. of Electr. Eng., Meiji Univ., Kawasaki, Japan
Abstract :
In order to reconstruct the 3D patterns of real electrical trees, we investigated the applicability of computerized tomography method (CTM) and the serial sectioning method (SSM). We also investigated the relationship between the fractal dimension of the reconstructed 3D patterns and that of projected 2D patterns of real electrical trees, from the point of view of fractal dimension. It was pointed out that it is important to estimate the fractal dimension of spatial patterns precisely and 3-dimensionally
Keywords :
computerised tomography; fractals; trees (electrical); computerized tomography method; electrical tree; fractal dimension; pattern reconstruction; serial sectioning method; three-dimensional fractal analysis; Degradation; Dielectrics and electrical insulation; Electrodes; Fractals; Needles; Pattern analysis; Plastic insulation; Polymers; Trees - insulation; Voltage;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location :
Vasteras
Print_ISBN :
0-7803-4237-2
DOI :
10.1109/ICSD.1998.709287
