A new approach for A/D converters testing

The authors present a system for checking the transfer functions of analog-to-digital converters, and, in general, of conversion systems, based on a structure that includes a PC, a programmable waveform generator, and an interfacing device for integrated components. Accuracy is checked as the sampling rate varies, so that, at the end of the test, one obtains the trend in the respect of the parameters that define the conversion errors corresponding to changes in operating conditions. These parameters are defined by mathematical algorithms, based on the Walsh transform and on its properties, which make it possible to introduces significant improvements in accuracy definition. Different test signal sources are used, as a function of the resolution and of the maximum sampling rate of the devices