Title :
AVMTM a more usable way to execute vectors at double speed
Author_Institution :
Schlumberger ATE, San Jose, CA, USA
Abstract :
Presents a hardware and software approach to the problem of executing test vectors at double the basic tester rate. The scheme avoids many of the pitfalls inherent in most double speed multiplexing schemes
Keywords :
automatic test equipment; integrated circuit testing; timing; AVM; automatic test systems; hardware approach; software approach; test vectors; tester rate; Computer architecture; Consumer electronics; Cost function; Hardware; Heart; Semiconductor device manufacture; Semiconductor device testing; Software testing; System testing; Timing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743270
