DocumentCode
2526869
Title
Image processing for granulometry analysis via neural networks
Author
Ferrari, Stefano ; Piuri, Vincenzo ; Scotti, Fabio
Author_Institution
Dipt. di Tecnol. dell´´Inf., Univ. degli Studi di Milano, Crema
fYear
2008
fDate
14-16 July 2008
Firstpage
28
Lastpage
32
Abstract
The analysis of granulometry of substances is relevant in a great variety of the research and industrial applications as such as the pharmaceutical sector, the food sector, the basic materials production and in the concrete and wood panel industries. This analysis is important since many relevant properties of the materials can depend on the distribution of the particles sizes/shapes during the production. In this work we present an innovative method capable to estimate the particles size distribution in an image without the use of segmentation techniques by using neural networks. The paper contribution is twofold. The proposed method presents a set of techniques based on wavelet analysis and image processing techniques suitable to extract relevant features for the granulometry analysis. Then, the extracted set of features is used as input to neural networks in order to achieve the classification of each single pixel accordingly to the probability to belong to a specific class of particles size (a single band in the histogram of the distribution of the particles size). The produced outputs have been used to perform the estimation of the particle granulometry contained in the image. Results are encouraging and show the effectiveness of the proposed method.
Keywords
image processing; neural nets; wavelet transforms; feature extraction; granulometry analysis; image processing; neural networks; wavelet analysis; Building materials; Cement industry; Feature extraction; Food industry; Image analysis; Image processing; Neural networks; Pharmaceuticals; Production; Wood industry; Granulometry analysis; image processing; neural networks; wavelet filtering;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Measurement Systems and Applications, 2008. CIMSA 2008. 2008 IEEE International Conference on
Conference_Location
Istanbul
Print_ISBN
978-1-4244-2305-7
Electronic_ISBN
978-1-4244-2306-4
Type
conf
DOI
10.1109/CIMSA.2008.4595827
Filename
4595827
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