Title :
Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement
Author :
Jenq, Y.C. ; Crosby, Phil
Author_Institution :
Tektronix Inc., Beaverton, OR, USA
Abstract :
A high-performance algorithm to estimate the four parameters (amplitude, DC offset, frequency and phase) of a sine wave from a sampled data record is presented. The estimation errors are obtained in closed form and can be controlled. The algorithm is non iterative and extremely fast. A Turbo Pascal implementation on the IBM PC/AT requires only a couple of seconds to do a 256-point fit. A method to measure a digitizer´s effective bits using this algorithm is presented. Simulation results indicate that the method gives excellent estimates of the true resolution of the simulated ideal digitizer. A 10-point effective-bits plot of a waveform digitizer under test can be accomplished in seconds instead of minutes or even hours as with other iterative algorithms
Keywords :
analogue-digital conversion; computerised signal processing; digital simulation; electronic equipment testing; parameter estimation; waveform analysis; DC offset; IBM PC/AT; Turbo Pascal; amplitude; curve fitting; effective bits measurement; estimation errors; frequency; high-performance algorithm; phase; simulated ideal digitizer; sinewave parameter estimation; waveform digitizer; Amplitude estimation; Circuit testing; Coupling circuits; Estimation error; Frequency estimation; Frequency shift keying; Iterative algorithms; Linear circuits; Parameter estimation; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IMTC.1988.10854