Title :
Measuring and fitting of the small signal model of the MOS transistor for high frequency applications
Author :
Vandeloo, P. ; Sansen, W.
Author_Institution :
Katholieke Univ., Leuven, Belgium
Abstract :
A small-signal model of a MOS transistor, valid at frequencies around the unity gain frequency, fT, is presented. As opposed to earlier models, it takes into account the non-quasi-static and transmission-line effects of the transistor. By using computer-controlled calibration of the test setup and network analyzer, mathematical transformations, and fit routines, all the AC parameters can be calculated from the measured S-parameters. The design of high-frequency conductance amplifiers shows that the model and measurement method are accurate at frequencies up to 3FT
Keywords :
calibration; computerised instrumentation; computerised signal processing; curve fitting; high-frequency amplifiers; insulated gate field effect transistors; network analysers; semiconductor device models; AC parameters; MOS transistor; S-parameters; computer-controlled calibration; computerised instrumentation; fit routines; fitting; high frequency applications; high-frequency conductance amplifiers; insulated gate FET; mathematical transformations; network analyzer; semiconductor device models; small signal model; transmission-line effects; unity gain frequency; Bandwidth; Capacitance; Circuits; Doping; Equations; Frequency conversion; Frequency measurement; MOSFETs; Transmission line measurements; Transmission line theory;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IMTC.1988.10857