Title :
Ion bombardment of polyimide films
Author :
Bachman, Bonnie J. ; Vasile, Michael J.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Abstract :
Surfaces of polyimide films have been bombarded with argon ions under controlled conditions and characterized by X-ray photoelectron spectroscopy (XPS). It was found that ion bombardment diminishes the carbonyl functionality of the film and that the initial chemical-shifted arene component in the main C1s transition decreases in intensity with increasing ion dose. XPS data also indicate that carbon bonding changes with increased ion doses or ion energies.<>
Keywords :
X-ray photoelectron spectra; ion beam effects; ion-surface impact; polymer films; radiation chemistry; Ar ion; C bonding; C1s transition; X-ray photoelectron spectroscopy; XPS; carbonyl functionality; chemical-shifted arene component; ion bombardment; polyimide film surface; Adhesives; Argon; Bonding; Chemicals; Polyimides; Polymer films; Rough surfaces; Spectroscopy; Surface contamination; Surface roughness;
Conference_Titel :
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/ECC.1988.12630
