Title :
R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique
Author :
Voyiatzis, I. ; Paschalis, A. ; Nikolos, D. ; Halatsis, C.
Author_Institution :
Inst. of Inf. & Telecommun., Athens, Greece
Abstract :
In this paper a novel input vector monitoring concurrent BIST technique based on a RAM (R-CBIST) is presented. This technique compares favorably to the other input vector monitoring concurrent BIST techniques proposed so far with respect to the hardware overhead and the time required for the concurrent test to be completed (concurrent test latency). R-CBIST can be used in practice for exhaustive testing of ROMs since it results in small hardware overhead whereas no need to stop the ROM normal operation is required
Keywords :
automatic testing; built-in self test; concurrent engineering; integrated circuit testing; logic testing; random-access storage; R-CBIST; RAM-based input vector monitoring; ROM normal operation; concurrent BIST technique; concurrent test; exhaustive testing; hardware overhead; test latency; Automatic testing; Built-in self-test; Circuit testing; Delay; Hardware; Informatics; Monitoring; Performance evaluation; Read only memory; Test pattern generators;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743284
