Title :
On-line testing of scalable signal processing architectures using a software test method
Author :
Aktouf, C. ; Al-Hayek, G. ; Robach, C.
Author_Institution :
LCIS-ESISAR, Valence, France
Abstract :
This paper presents a unified approach which allows efficient concurrent tests to be considered when synthesizing scalable signal processing multiprocessor architectures. The approach is based on two earlier works. The first work has allowed the synthesis of scalable multiprocessor architectures where comparison testing is considered. The second work has shown the feasibility of using a software technique called mutation testing to successfully test hardware devices. The presented approach ensures that VLSI digital signal processors (DSP) are totally tested concurrently within useful computation. Based on realistic examples of signal processing applications and state-of-the-art DSPs, the approach is shown to be highly efficient in terms of fault coverage and fault latency
Keywords :
VLSI; automatic testing; concurrent engineering; digital signal processing chips; fault diagnosis; integrated circuit reliability; integrated circuit testing; logic testing; multiprocessing systems; VLSI; comparison testing; concurrent tests; fault coverage; fault latency; multiprocessor architectures; mutation testing; scalable signal processing architectures; signal processing applications; software test method; Computer architecture; Concurrent computing; Digital signal processing; Digital signal processors; Genetic mutations; Hardware; Signal processing; Signal synthesis; Software testing; Very large scale integration;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743285