Title :
Standard test interface language (STIL), extending the standard
Author_Institution :
Test Syst. Strategies Inc., Beaverton, OR, USA
Abstract :
This paper is a status report on the current state of STIL (standard tester interface language) as developed by the IEEE-P1450 standards development committee, followed by a comprehensive overview of the areas that the committee is pursuing for the next round of development for the language. This paper explains the rationale for the extensions being worked on, the applications for these extensions, the process, and the time frame that is expected for this development
Keywords :
IEEE standards; automatic test pattern generation; high level languages; integrated circuit testing; ATPG; IC testing; IEEE-P1450 standards development committee; STIL; language extensions; standard test interface language; time frame; Circuit testing; HTML; Integrated circuit testing; Production; Standardization; Standards development; System testing; Transportation; Uniform resource locators; Voting;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743291
