Title :
Contact Material for Vacuum Interrupters based on CuCr with a Specific High Short Circuit Interruption Ability
Author_Institution :
ABB AG, Ratingen
Abstract :
Vacuum interrupters (VI) with specific high short circuit interruption ability are mostly equipped with the well known contact material based on copper and chromium. A review of different production techniques as well as behaviour and microstructure of commercially available materials is presented with emphasis on two of the predominantly applied methods. The contact material´s switching performance strongly depends on it´s mechanical properties, gas and element concentration evaluated for each batch of base material. The contacts microstructure is investigated using scanning electron microscopy (SEM) and energy dispersive X-ray (EDX). Switching performance is proven on standard Vis and the examination is held in a high performance lab by interrupting a sequence with a huge number of short circuit currents in accordance to the standards according IEC 62271-100. When conducting limitation tests at higher demands than required a ranking of material batches is presented. The study is based on standard contact material with a chromium content of 25 wt.% used on the transverse magnetic field (TMF) contact system. Derived from the results a very compact VI for a rating of 40.5 kV at 40 kA with increased specific performance is introduced
Keywords :
IEC standards; X-ray chemical analysis; chromium alloys; composite materials; copper alloys; crystal microstructure; electrical contacts; scanning electron microscopy; vacuum interrupters; 40 kA; 40.5 kV; CuCr; EDX; IEC 62271-100 standard; SEM; commercially available materials; contact material; contacts microstructure; element concentration; energy dispersive X-ray; gas concentration; limitation tests; material batches ranking; material behaviour; material microstructure; mechanical properties; production techniques; scanning electron microscopy; specific high short circuit interruption ability; switching performance; transverse magnetic field contact system; vacuum interrupters; Chromium; Circuits; Conducting materials; Copper; IEC standards; Interrupters; Magnetic materials; Microstructure; Production; Scanning electron microscopy;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
Conference_Location :
Matsue
Print_ISBN :
1-4244-0191-7
DOI :
10.1109/DEIV.2006.357331