DocumentCode
2527278
Title
Study by electron microscopy investigations (TEM, SEM, ED, HVEM) of treeing (from pre-breakdown to breakdown) induced by accelerated methods
Author
Popescu-Pogrion, Nicoleta ; Notingher, P. ; Hopfe, Sigrid
Author_Institution
Inst. for Atom. Phys., INCDFM, Bucharest, Romania
fYear
1998
fDate
22-25 Jun 1998
Firstpage
325
Lastpage
328
Abstract
In this paper we have studied the evolution of treeing (from pre-breakdown to breakdown) induced by accelerated methods-like electron or laser beam irradiation-in polyethylene. The growth of treeing is very closely related to the structural changes of polyethylene observed by different electron microscopy investigations-like transmission electron microscopy, high voltage electron microscopy, scanning electron microscopy etc.-and thus we consider that it can be used as an ageing indicator. The increased role of polymers in the field of high technologies requires the structural study of dielectric. The polyethylene (linear thermoplastic polymer) is used like cable isolation in the nuclear power plants. The polyethylene has very good dielectric properties and good stability of its properties in usual conditions. Pre-breakdown, treeing discharge and breakdown phenomena in polyethylene are particularly sensitive to the conditions of samples such as specimen defects (especially at the surface), nature of beam, ambient medium, temperature, time and the mode in which the phenomenon occurs. The authors would also suggest that more attention should be given to the study of influence of the surface defects, impurities, specimen geometry, temperature and especially the transformations of the structure in the presence of breakdown phenomenon
Keywords
ageing; electron beam effects; insulation testing; laser beam effects; life testing; polyethylene insulation; scanning electron microscopy; transmission electron microscopy; trees (electrical); ED; HVEM; SEM; TEM; accelerated methods; ageing indicator; ambient medium; electron beam irradiation; laser beam irradiation; linear thermoplastic polymer; polyethylene; specimen defects; specimen geometry; treeing; Acceleration; Dielectrics; Electric breakdown; Electron beams; Electron microscopy; Particle beams; Polyethylene; Polymers; Scanning electron microscopy; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location
Vasteras
Print_ISBN
0-7803-4237-2
Type
conf
DOI
10.1109/ICSD.1998.709291
Filename
709291
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