• DocumentCode
    252731
  • Title

    Aging effect on creep properties of SnBi solders

  • Author

    Sakane, M. ; Yagi, K. ; Itoh, T. ; Yamashita, M. ; Hokazono, H.

  • Author_Institution
    Dept. of Mech. Eng., Ritsumeikan Univ., Kusatsu, Japan
  • fYear
    2014
  • fDate
    3-5 Dec. 2014
  • Firstpage
    583
  • Lastpage
    586
  • Abstract
    This paper discusses the effects of additive elements and aging on creep properties of SnBi solder system. Creep tests were performed on unaged and aged SnBi, SnBiAg and SnBiAgCuNiGe solders at three temperatures and the effects of them on creep rupture lifetimes and creep strain rates were discussed. The additive elements decreased creep strain rates and elongated creep rupture lifetimes. Causes of the effects were discussed from EBSD observations. The additive elements reduced the grain size and the aging coarsened grain size. The grain size had a pronounced effect on the creep strain rates and rupture lifetimes.
  • Keywords
    ageing; alloying additions; bismuth alloys; copper alloys; creep; creep testing; germanium alloys; grain size; nickel alloys; silver alloys; solders; tin alloys; EBSD observation; SnBi; SnBiAg; SnBiAgCuNiGe; additive element; aging coarsened grain size; aging effect; creep property; creep strain rate; creep test; elongated creep rupture lifetime; solder system; Aging; Bismuth; Creep; Grain size; Strain; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
  • Conference_Location
    Singapore
  • Type

    conf

  • DOI
    10.1109/EPTC.2014.7028312
  • Filename
    7028312