DocumentCode :
2527314
Title :
Influence of conductor loss and thickness in coplanar circuit elements
Author :
Vietzorreck, L. ; Pascher, W.
Author_Institution :
Allgemeine und Theor. Elektrotech., Fern Univ., Hagen, Germany
Volume :
3
fYear :
1997
fDate :
8-13 June 1997
Firstpage :
1811
Abstract :
The small dimensions of CPWs require due consideration of finite conductivity and metallization thickness. For this purpose an efficient Method of Lines approach for full-wave analysis of microstrip discontinuities is considerably extended. Two alternative loss models are employed depending on the skin depth. Several cascaded coplanar discontinuities including a quarterwave transformer and a double step are characterized.
Keywords :
MMIC; S-parameters; coplanar waveguides; impedance convertors; integrated circuit metallisation; losses; microstrip discontinuities; skin effect; CPWs; MMIC applications; cascaded coplanar discontinuities; conductor loss; coplanar circuit elements; double step; finite conductivity; full-wave analysis; loss models; metallization thickness; method of lines approach; microstrip discontinuities; quarterwave transformer; scattering parameters; skin depth; Circuits; Conductivity; Conductors; Coplanar waveguides; Metallization; Microstrip; Skin; Strips; Surface treatment; Transmission line discontinuities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3814-6
Type :
conf
DOI :
10.1109/MWSYM.1997.596906
Filename :
596906
Link To Document :
بازگشت