Title :
A dual-gate ambipolar graphene field effect transistor
Author :
Wang Pan ; Yang Li ; Wuzhu Deng ; Yangyang Chen ; Wenli Zhou
Author_Institution :
Sch. of Opt. & Electron. Inf., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
A Dual-gate graphene field effect transistor was fabricated with HfO2 and SiO2 as the back and top dielectric layers on silicon substrate, respectively. The CVD grown graphene was transferred a process by spin-coating a PMMA layer. The electrical properties of the graphene transistors were investigated. Ambipolar behavior of field effect transistor is demonstrated with the carrier mobility of the channel between 3000 to 4500cm2/Vs. It is found that the AZ5214 photoresist covered on graphene during the fabrication process induces its p-type doping and annealing can reduce the impurity concentration dramatically.
Keywords :
chemical vapour deposition; field effect transistors; graphene; hafnium compounds; photoresists; silicon compounds; spin coating; AZ5214 photoresist; CVD grown graphene; HfO2; PMMA layer; SiO2; ambipolar behavior; annealing; back dielectric layers; carrier mobility; dual gate ambipolar graphene field effect transistor; electrical properties; p-type doping; spin coating; top dielectric layers; Dielectrics; Field effect transistors; Graphene; Hafnium compounds; Resists; Silicon; HfO2; ambipolar; field effect transistor; graphene;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2014 9th IEEE International Conference on
Conference_Location :
Waikiki Beach, HI
DOI :
10.1109/NEMS.2014.6908801