DocumentCode :
2527440
Title :
Investigation in to growth of electrical trees in XLPE cables under transient voltages
Author :
Sarathi, R. ; Sridhar, K.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Madras, India
fYear :
1998
fDate :
22-25 Jun 1998
Firstpage :
329
Lastpage :
332
Abstract :
The authors study about inception, propagation and termination of electrical trees in XLPE cable insulation. They address the problem relating to development of electrical trees under various transient voltage profiles and detail the method of generating the experimental database. Also the physico-chemical changes in the treed zone are analysed using Wide Angle X-ray Diffraction (WAXD) and through Fourier Transform Infra-red Spectroscopy (FTIR) analysis
Keywords :
Fourier transform spectra; X-ray diffraction; XLPE insulation; infrared spectra; power cable insulation; transients; trees (electrical); Fourier transform infrared spectroscopy; XLPE cable insulation; database; electrical tree; transient voltage; wide angle X-ray diffraction; Cables; Circuits; Costs; Dielectrics and electrical insulation; Frequency; Needles; Power system transients; Trees - insulation; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location :
Vasteras
Print_ISBN :
0-7803-4237-2
Type :
conf
DOI :
10.1109/ICSD.1998.709292
Filename :
709292
Link To Document :
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