DocumentCode :
2527483
Title :
Estimation of frequency offset, cell ID and CP length in OFDMA mode of WMAN
Author :
Pushpa, K. ; Kishore, Ch Nanda ; Yoganandam, Y.
Author_Institution :
Malla Reddy Inst. of Tech & Sci., Secunderabad
fYear :
2008
fDate :
19-21 Nov. 2008
Firstpage :
1
Lastpage :
5
Abstract :
Orthogonal Frequency Division Multiple Access (OFDMA) gains increasing attention for broadband, high data rate fixed/mobile communications. As the basic modulation technique in OFDMA is orthogonal frequency division multiplexing (OFDM), it is severely affected by carrier frequency offset (CFO). The CFO causes loss of orthogonality among the subcarriers. In this paper, we propose a method for joint estimation of CFO and cell ID. Cell ID represents the number of the preamble selected by the base station in the downlink. The proposed method is based on the preamble suggested for OFDMA mode of WMAN where the preamble is loaded on every third subcarrier. The proposed method is an extension of Schimdl and Coxpsilas method. We also propose a method for estimation of CP length. Van de Beekpsilas method is adapted for the estimation of CP length in OFDMA mode of WMAN. Simulations are conducted for AWGN and frequency selective channels to demonstrate the performance of the proposed methods.
Keywords :
AWGN channels; WiMax; frequency division multiple access; frequency estimation; mobile radio; AWGN channels; CP length estimation; OFDMA mode; WMAN; base station; cell ID; data rate fixed/mobile communications; frequency offset estimation; frequency selective channels; orthogonal frequency division multiple access; Base stations; Bit error rate; Downlink; Frequency conversion; Frequency estimation; Frequency synchronization; Intersymbol interference; Mobile communication; OFDM modulation; Transmitters; BWA; CP length; OFDM; OFDMA; WMAN; cell ID; cyclic prefix; frequency offset estimation; frequency synchronization; preamble;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4244-2408-5
Electronic_ISBN :
978-1-4244-2409-2
Type :
conf
DOI :
10.1109/TENCON.2008.4766566
Filename :
4766566
Link To Document :
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