Title :
Test set embedding into low-power sequences based on a traveling salesman problem formulation
Author :
Voyiatzis, I. ; Efstathiou, C. ; Magos, D. ; Sgouropoulou, C.
Author_Institution :
Dept. of Inf., Technol. Educ. Inst. of Athens, Athens, Greece
Abstract :
Current trends in VLSI designs necessitate low power during both normal system operation and testing activity. Traditional Built-in Self Test (BIST) generators rise the power consumption during testing, necessitating the addition of low-power solutions to the arsenal of BIST pattern generators. In this paper, the utilization of gray codes is investigated as a low-power BIST solution; Experimental results indicate that the investigated generators can result into shorter lower-power BIST sequences, compared to previously proposed solutions.
Keywords :
Gray codes; VLSI; built-in self test; integrated circuit testing; low-power electronics; travelling salesman problems; BIST pattern generators; VLSI designs; built-in self test generators; gray codes; low-power sequences; normal system operation; power consumption; testing activity; traveling salesman problem formulation; Built-in self-test; Clocks; Generators; Radiation detectors; Reflective binary codes; Switches;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2012 7th International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-1-4673-1926-3
DOI :
10.1109/DTIS.2012.6232965
