DocumentCode :
2527733
Title :
Testing mixed signal SOCs
Author :
Burns, Mark
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
1132
Abstract :
There are dozens of issues that will make the testing of mixed signal systems-on-a-chip (SOCs) difficult and costly. Many of these issues are the same ones that have been with the testing community for years. But there are a few testing issues that are either unique to mixed signal SOCs or at least are extremely exaggerated in these highly integrated designs. The problems fall into three basic categories: test development time, analog and mixed-signal performance, and production cost. These problems are briefly discussed
Keywords :
fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; analog performance; highly integrated designs; mixed signal systems-on-a-chip; mixed-signal performance; production cost; test development challenges; test development time; test simulation; testing problems; Circuit simulation; Circuit testing; Costs; Instruments; Logic testing; Merging; Production; Signal design; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743322
Filename :
743322
Link To Document :
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